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  • FISCHERSCOPE X-RAY XDVM u (SD)

FISCHERSCOPE X-RAY XDVM u (SD)

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$7,324.00
$7,324.00
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per item
The FISCHERSCOPE® X-RAY XDVM µ (SD) is used for the analysis of coating systems on microstructures. Due to its novel, patented mirror X-ray optics, this instrument can generate very small measurement spots of only about 20 µm x 50 µm in size with very high radiation intensities.
Contrary to the purely µ-design version, the XDVM®-µ-SD version does not use a proportional counter tube as a detector but instead a Si PIN diode. (SD means Solid State Detector). This high-quality semiconductor detector does not require cooling with liquid nitrogen and still enables a very high energy resolution. The SD design is, therefore, predestined for the analysis of completely unknown samples.
Thus, this instrument is suited for quality control of miniaturized pc-boards, chips or contacts. Measurements are possible on structures that are only a few 10 micrometers wide.
Because of this new X-ray optics, the X-RAY XDVM®-µ-SD is capable of analyzing coating systems on very thin structures for thickness and composition, even in areas where conventional X-ray fluorescence instruments have to pass, due to insufficient radiation intensity.
The WinFTM® V.6 Software allows for the analysis of multi-coating systems with up to 24 individual layers or of alloys with up to 24 different elements .

Please note:
The version XDVM-µ-SD-C is for applications, where a small measuring spot as well as a high x-ray intensity is needed.
The x-ray optics consists of a polycapillary system which is focussing the primary x-ray beam on the measuring spot of the sample.
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  • ABOUT US
  • STORE
  • PRODUCT
    • Bruker
    • Elvatech
    • Helmut-fischer
    • ICI HandHeld Infrared
    • INNO Fusion Splicer
    • Olympus-ims
    • Oxford-instruments
    • RIGAKU
    • Spectro ametek
    • Skyray Instrument
    • SciAps
    • Topcon Positioning handheld
    • TSI
    • Thermo Scientific Niton
    • Quickshot XRF
  • ​PRIVACY POLICY
  • ​PAYMENT METHODS
  • CONTACT