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  • FISCHERSCOPE® X-RAY XDLM

FISCHERSCOPE® X-RAY XDLM

SKU:
$9,272.00
$9,272.00
Unavailable
per item
X-ray fluorescence (XRF) measuring instrument for manual or automated coating thickness measurements and analyses on pc-boards, electronics components and mass-produced parts, even on small components
Features
Very universal because equipped with a micro-focus tube, 4-x aperture changer and 3 primary filters
Suitable for smaller structures such as connector contacts or printed circuit boards
Larger measuring distances are possible as well (DCM, stroke 0-80 mm)
Large and spacious measurement chamber with a cutout
(C-slot)
A programmable stage for automated measurements is available 

Typical fields of application
Measurement of e.g. thin gold, palladium and nickel coatings in the PC Board industry
Measurement of coated connectors and contacts
Measurement of functional coatings in the electronics and semiconductor industries
Gold, jewellery and watch industries 
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  • ABOUT US
  • STORE
  • PRODUCT
    • Bruker
    • Elvatech
    • Helmut-fischer
    • ICI HandHeld Infrared
    • INNO Fusion Splicer
    • Olympus-ims
    • Oxford-instruments
    • RIGAKU
    • Spectro ametek
    • Skyray Instrument
    • SciAps
    • Topcon Positioning handheld
    • TSI
    • Thermo Scientific Niton
    • Quickshot XRF
  • ​PRIVACY POLICY
  • ​PAYMENT METHODS
  • CONTACT