Bruker S1 TITAN Handheld XRF Spectrometer
The S1 TITAN is among the lightest (1.5 kg, including battery) tube-based handheld XRF analyzers on the market today. Fast analysis speed and exceptional accuracy are two key attributes that help define the S1 TITAN.
Other innovative features include an integrated touch-screen color display, 50 kV X-ray tube, SMART GradeTM timing, SharpBeamTM optimized X-ray geometry, Silicon Drift Detector (SDD), and an extremely tough housing that is sealed against humid and dusty environments. Contact our sales team today to learn more about the innovative S1 TITAN!
The S1 TITAN series is available in four (4) configurations: models 800, 600, 500 and 200. All models use Bruker’s SharpBeamTM technology. The S1 TITAN 800 and 600 use a FAST SDD® detector to give you incredibly fast analysis times. The S1 TITAN 500 is configured with a fast, accurate, and affordable standard SDD detector. The S1 TITAN 200 is configured with an economical Si-PIN detector. In addition, the S1 TITAN can be configured with calibrations that are optimized for a variety of sample materials- including a wide range of alloys, various mining & environmental samples, as well as restricted materials.
SharpBeamTM technology
The S1 TITAN’s patent pending SharpBeamTM technology optimizes the detector and tube geometry. The optimized geometry has many desirable effects, including:
Reduces power requirements
Reduces weight
Improves measurement precision
Improved detection limits
Increases battery life
S1 TITAN Technical Details
NEW! pXRF Specification comparison (PDF)
Calibration range (depending on specific calibration):
S1 TITAN 800: 37 elements, including light elements Mg, Al & Si
S1 TITAN 600: 37 elements, including light elements Mg, Al & Si
S1 TITAN 500: 32 elements
S1 TITAN 200: 32 elements
Weight: 1.5 kg (3.3 lbs) with battery
Size: 25 cm x 28 cm x 9 cm (10 in x 11 in x 3.7 in)
Sample temperature:
S1 TITAN 800: Default to 150°C with Ultralene® window. Up to 500°C with Kapton® window and hot surface adapter.
S1 TITAN 600: Default to 150°C with Ultralene® window. Up to 500°C with Kapton® window and hot surface adapter.
S1 TITAN 500: up to 500°C
S1 TITAN 200: up to 500°C
TITAN Detector ShieldTM:
Included on all S1 TITAN models
Integrated camera:
S1 TITAN 800: Included
S1 TITAN 600: Optional
S1 TITAN 500: Not available
S1 TITAN 200: Not available
Detector:
S1 TITAN 800: FAST SDD®
S1 TITAN 600: FAST SDD®
S1 TITAN 500: Standard SDD
S1 TITAN 200: Si-PIN
Collimator options:
S1 TITAN 800: 5mm standard. Optional 8mm or 3mm
S1 TITAN 600: 5mm
S1 TITAN 500: 5mm
S1 TITAN 200: 5mm
X-ray tube: Rh target; max voltage 50 kV
Filter changer:
S1 TITAN 800: Five position motorized filter changer
S1 TITAN 600: Five position motorized filter changer
S1 TITAN 500: Fixed filter
S1 TITAN 200: Fixed filter
Languages Supported: Chinese, Chinese simplified, Dutch, English, French, French Canadian, German, Indonesian, Italian, Japanese, Korean, Polish, PortugueseBR, Russian, SpanishMEX, SpanishSPN, Thai, Turkish
QA/QC and positive material identification (PMI) in fabrication
PMI for plant / refinery safety
Scrap metal sorting
Aerospace alloys
Gold testing
Precious metals testing
Mine face
Ore grade control
Core analysis
Mineral exploration
Food Safety & Agriculture
Geochemical mapping
Soil analysis
Metal recovery
Lead in Children’s Products
ASTM-F963
Toxics in Packaging Clearing House (TPCH)
Screening Children’s Apparel for Lead
Proposition 65 Compliance
RoHS
More
Other innovative features include an integrated touch-screen color display, 50 kV X-ray tube, SMART GradeTM timing, SharpBeamTM optimized X-ray geometry, Silicon Drift Detector (SDD), and an extremely tough housing that is sealed against humid and dusty environments. Contact our sales team today to learn more about the innovative S1 TITAN!
The S1 TITAN series is available in four (4) configurations: models 800, 600, 500 and 200. All models use Bruker’s SharpBeamTM technology. The S1 TITAN 800 and 600 use a FAST SDD® detector to give you incredibly fast analysis times. The S1 TITAN 500 is configured with a fast, accurate, and affordable standard SDD detector. The S1 TITAN 200 is configured with an economical Si-PIN detector. In addition, the S1 TITAN can be configured with calibrations that are optimized for a variety of sample materials- including a wide range of alloys, various mining & environmental samples, as well as restricted materials.
SharpBeamTM technology
The S1 TITAN’s patent pending SharpBeamTM technology optimizes the detector and tube geometry. The optimized geometry has many desirable effects, including:
Reduces power requirements
Reduces weight
Improves measurement precision
Improved detection limits
Increases battery life
S1 TITAN Technical Details
NEW! pXRF Specification comparison (PDF)
Calibration range (depending on specific calibration):
S1 TITAN 800: 37 elements, including light elements Mg, Al & Si
S1 TITAN 600: 37 elements, including light elements Mg, Al & Si
S1 TITAN 500: 32 elements
S1 TITAN 200: 32 elements
Weight: 1.5 kg (3.3 lbs) with battery
Size: 25 cm x 28 cm x 9 cm (10 in x 11 in x 3.7 in)
Sample temperature:
S1 TITAN 800: Default to 150°C with Ultralene® window. Up to 500°C with Kapton® window and hot surface adapter.
S1 TITAN 600: Default to 150°C with Ultralene® window. Up to 500°C with Kapton® window and hot surface adapter.
S1 TITAN 500: up to 500°C
S1 TITAN 200: up to 500°C
TITAN Detector ShieldTM:
Included on all S1 TITAN models
Integrated camera:
S1 TITAN 800: Included
S1 TITAN 600: Optional
S1 TITAN 500: Not available
S1 TITAN 200: Not available
Detector:
S1 TITAN 800: FAST SDD®
S1 TITAN 600: FAST SDD®
S1 TITAN 500: Standard SDD
S1 TITAN 200: Si-PIN
Collimator options:
S1 TITAN 800: 5mm standard. Optional 8mm or 3mm
S1 TITAN 600: 5mm
S1 TITAN 500: 5mm
S1 TITAN 200: 5mm
X-ray tube: Rh target; max voltage 50 kV
Filter changer:
S1 TITAN 800: Five position motorized filter changer
S1 TITAN 600: Five position motorized filter changer
S1 TITAN 500: Fixed filter
S1 TITAN 200: Fixed filter
Languages Supported: Chinese, Chinese simplified, Dutch, English, French, French Canadian, German, Indonesian, Italian, Japanese, Korean, Polish, PortugueseBR, Russian, SpanishMEX, SpanishSPN, Thai, Turkish
QA/QC and positive material identification (PMI) in fabrication
PMI for plant / refinery safety
Scrap metal sorting
Aerospace alloys
Gold testing
Precious metals testing
Mine face
Ore grade control
Core analysis
Mineral exploration
Food Safety & Agriculture
Geochemical mapping
Soil analysis
Metal recovery
Lead in Children’s Products
ASTM-F963
Toxics in Packaging Clearing House (TPCH)
Screening Children’s Apparel for Lead
Proposition 65 Compliance
RoHS
More
$
13,900.00
Bruker TRACER 5i handheld XRF spectrometer
introducing the all new, TRACER 5i pXRF spectrometer; ideal for Methods Development, Research and Complex Materials.
TRACER 5i is the high value in-situ pXRF performer synchronizing power, function, precision and accuracy for dynamic, field capable laboratory-like elemental analysis.
Complete user control
The TRACER 5i allow complete user control of the excitation conditions. These can be developed using recommended settings in the software or user preferences.
Current
Voltage
Automated filter
Manual filter
Sample spot size
Vacuum, Helium or air
The TRACER 5i settings and measurements can be controlled on the handheld or with Artax™ advanced spectral analysis PC software, via WiFi or USB.
Users can also develop their own calibrations with EasyCal PC software for empirical correlations. These can be transferred to the TRACER 5i operating system for point-and-shoot tests.
Benefits at a glance:
In-Situ Untethered & Interactive
Integrated display embedded operating and analytical software
Relaxed Hand Grip™ strap for comfort and security
EasyAccess™ Rail for on-the-go accessories
Control, save and send with USB, Wi-Fi, Bluetooth
High Performance
SharpBeam™ geometry for minimized distance between sample and detector
Pressure and temperature monitoring and compensation
Automated filter wheel AND manual filter slot
Air, helium or vacuum capable
Most sensitive TRACER available
Fast, accurate spot positioning
Internal camera with adjustable LED for full view
Target area and reticle positioning for precision
Remote view projection for challenging objects
Confidence in analytical results
The TRACER Series includes the following models:
TRACER 5i
TRACER III-V+
TRACER III-SD
TRACER IV-SD
Applications & Materials:
TRACER pXRF analyzers serve a wide range of applications and material needs from everyday point-and-shoot testing to the ever-changing complexities of advanced applications and research. Please contact our scientists to discuss your application.
Whether it is in art conservation and archaeology, for teaching, in food safety and agriculture applications, for geochemistry or advanced materials, TRACERs can thoroughly and accurately analyze the elemental composition and identify standard or complex materials.
TRACERs can analyze multiple sample types, including liquids, slurries, powders, soils, sediment, sludge, cellulose, polymers, paper, solids, metals and alloys.
TRACER 5i Technical Details
NEW! pXRF Specification comparison (PDF)
Interactive touchscreen: High performance and contrast daylight visible TFT LCD 3.7” touchscreen display
Collimation: Selectable collimation includes 3 and 8 mm spot sizes
Geometry: Features patented SharpBeam™ beam path for best performance at low power
Data storage & transfer: Data storage card, I/O ports, Wi-fi and Bluetooth connectivity to save and transmit data from the field
Convenience features: TrueTouch trigger switch, ambidextrous Relaxed Hand Grip™ strap and EasyAccess™ rail for accessories
Integrated camera: Internal VGA CMOS camera with ability to store up to 5 photos per assay
Weight: 1.9 kg (4.1 lbs) with battery; 1.6 kg (3.6 lbs) base weight
Size: 27.3 cm(L) x 9.4 cm(w) x 29.5 cm(H)
Detector: Proprietary 40mm2 silicon drift detector with < 140 eV @ 250,000 cps Mn Ka
X-ray tube: Rh target thin window; max voltage 50 kV
Filter changer: Selectable automated internal 5 position primary beam filter changer wheel with pre-installed filters; manual insertion filter/secondary target slot for factory or user-made filters; two manual filter holders
Vacuum pump attachment: Yes. Allows for enhanced light element sensitivity
Gas flow chamber: Yes. Allows for the measurement of gases down to Ne
Software-driven voltage and current control: Included
Instrument stand: Included, for desktop applications
TRACER 5i is the high value in-situ pXRF performer synchronizing power, function, precision and accuracy for dynamic, field capable laboratory-like elemental analysis.
Complete user control
The TRACER 5i allow complete user control of the excitation conditions. These can be developed using recommended settings in the software or user preferences.
Current
Voltage
Automated filter
Manual filter
Sample spot size
Vacuum, Helium or air
The TRACER 5i settings and measurements can be controlled on the handheld or with Artax™ advanced spectral analysis PC software, via WiFi or USB.
Users can also develop their own calibrations with EasyCal PC software for empirical correlations. These can be transferred to the TRACER 5i operating system for point-and-shoot tests.
Benefits at a glance:
In-Situ Untethered & Interactive
Integrated display embedded operating and analytical software
Relaxed Hand Grip™ strap for comfort and security
EasyAccess™ Rail for on-the-go accessories
Control, save and send with USB, Wi-Fi, Bluetooth
High Performance
SharpBeam™ geometry for minimized distance between sample and detector
Pressure and temperature monitoring and compensation
Automated filter wheel AND manual filter slot
Air, helium or vacuum capable
Most sensitive TRACER available
Fast, accurate spot positioning
Internal camera with adjustable LED for full view
Target area and reticle positioning for precision
Remote view projection for challenging objects
Confidence in analytical results
The TRACER Series includes the following models:
TRACER 5i
TRACER III-V+
TRACER III-SD
TRACER IV-SD
Applications & Materials:
TRACER pXRF analyzers serve a wide range of applications and material needs from everyday point-and-shoot testing to the ever-changing complexities of advanced applications and research. Please contact our scientists to discuss your application.
Whether it is in art conservation and archaeology, for teaching, in food safety and agriculture applications, for geochemistry or advanced materials, TRACERs can thoroughly and accurately analyze the elemental composition and identify standard or complex materials.
TRACERs can analyze multiple sample types, including liquids, slurries, powders, soils, sediment, sludge, cellulose, polymers, paper, solids, metals and alloys.
TRACER 5i Technical Details
NEW! pXRF Specification comparison (PDF)
Interactive touchscreen: High performance and contrast daylight visible TFT LCD 3.7” touchscreen display
Collimation: Selectable collimation includes 3 and 8 mm spot sizes
Geometry: Features patented SharpBeam™ beam path for best performance at low power
Data storage & transfer: Data storage card, I/O ports, Wi-fi and Bluetooth connectivity to save and transmit data from the field
Convenience features: TrueTouch trigger switch, ambidextrous Relaxed Hand Grip™ strap and EasyAccess™ rail for accessories
Integrated camera: Internal VGA CMOS camera with ability to store up to 5 photos per assay
Weight: 1.9 kg (4.1 lbs) with battery; 1.6 kg (3.6 lbs) base weight
Size: 27.3 cm(L) x 9.4 cm(w) x 29.5 cm(H)
Detector: Proprietary 40mm2 silicon drift detector with < 140 eV @ 250,000 cps Mn Ka
X-ray tube: Rh target thin window; max voltage 50 kV
Filter changer: Selectable automated internal 5 position primary beam filter changer wheel with pre-installed filters; manual insertion filter/secondary target slot for factory or user-made filters; two manual filter holders
Vacuum pump attachment: Yes. Allows for enhanced light element sensitivity
Gas flow chamber: Yes. Allows for the measurement of gases down to Ne
Software-driven voltage and current control: Included
Instrument stand: Included, for desktop applications
$
14,890.00
Bruker EOS 500 Handheld LIBS
Bruker's new EOS 500 is a handheld Laser Induced Breakdown Spectroscopy (HH-LIBS) system. The EOS 500 is based on laser excitation of a metal sample followed by quantitative analysis of the light generated in the plume. This technology provides quick (3-5 sec) analysis of alloys including aluminum/titanium/magnesium alloys.
The EOS is especially well suited to scrap sorting of these alloys because of its quick and user friendly operation. In addition to the normal XRF elements, the EOS is capable of measuring very light elements such as Li, Be and B; as well as laser fast analysis of Mg, Al, Si.
HH-LIBS and HH-XRF
Physics indicates that HH-LIBS and HH-XRF are naturally complementary and each technique is preferred to measure certain elements and certain types of alloys. HH-LIBS is well suited to rapidly measuring the low atomic number elements like the alkaline (Li, Na, etc.) and alkaline-earth metals (Be, Mg, etc.) but are not well suited to measuring high atomic number elements such as the refractory elements (Nb, Mo, W, etc.). HH-XRF on the other hand, is well suited to measuring high atomic number elements but not well suited at measuring low atomic number elements like Mg, Al, Si. This makes HH-LIBS the ideal technique for measuring light alloys such as Mg, Al and Ti alloys while HH-XRF is the ideal technique for measuring standard alloys like stainless steel, high temperature alloys and the like. Now is your chance; choose the right tool for the job!
The EOS is especially well suited to scrap sorting of these alloys because of its quick and user friendly operation. In addition to the normal XRF elements, the EOS is capable of measuring very light elements such as Li, Be and B; as well as laser fast analysis of Mg, Al, Si.
HH-LIBS and HH-XRF
Physics indicates that HH-LIBS and HH-XRF are naturally complementary and each technique is preferred to measure certain elements and certain types of alloys. HH-LIBS is well suited to rapidly measuring the low atomic number elements like the alkaline (Li, Na, etc.) and alkaline-earth metals (Be, Mg, etc.) but are not well suited to measuring high atomic number elements such as the refractory elements (Nb, Mo, W, etc.). HH-XRF on the other hand, is well suited to measuring high atomic number elements but not well suited at measuring low atomic number elements like Mg, Al, Si. This makes HH-LIBS the ideal technique for measuring light alloys such as Mg, Al and Ti alloys while HH-XRF is the ideal technique for measuring standard alloys like stainless steel, high temperature alloys and the like. Now is your chance; choose the right tool for the job!
$
12,500.00
Bruker S4 TStar
Rapid and Cost-Efficient TXRF — A Real Alternative to ICP
Total reflection X-ray fluorescence (TXRF) spectroscopy is a well-established method for trace element analysis of a variety of samples. The S4 TStar simplifies TXRF for 24/7 routine operation with guaranteed data quality. Significant improvements of detection limits are accompanied by automatic QC procedures, useful software routines and a unique versatility in terms of sample types and carriers.
Your Benefits
The benchtop TXRF spectrometer S4 TStar offers lowest detection limits in the sub-ppb range.
Automatic quality control features provide confidence in data and instrument quality.
Maximum versatility for a direct analysis of many types of samples on different carriers.
Optimized for 24/7 operation in industrial routine analysis.
Designed for multi-user operation with a high capacity of 90 samples.
A selection of sample trays and other tools accelerates sample preparation and minimizes errors and contamination risks.
No Worries About New Pharma, Food and Environmental Regulations
S4 TStar is a powerful tool for food fraud prevention in globalized supply chains; e.g. food safety according to FAO/WHO standards realized by direct analysis of low levels of As in rice.
S4 TStar monitors catalyzer elements in pharmaceutical production according to upcoming US and EU Pharmacopeia guidelines; e.g. detection of sub-ppm catalyzer elements in active pharmaceutical ingredients (API) and additives.
S4 TStar provides a versatile solution for water, effluent, air and soil analysis for the recovery of a healthy environment; e.g. environmental monitoring by direct measurement of contaminants in wastewater, slurries and effluents in the low ppb range.
Outstanding Sample Versatility
The S4 TStar is a very versatile tool for the analysis of a great variety of sample types on different reflective carriers. This puts it ahead of ICP, which requires fully dissolved liquid samples.
Automatic QC Procedure
S4 TStar is the first TXRF spectrometer that automatically runs QC routines for operational and performance qualification in the background. Integrated QA samples allow automatic stability and sensitivity checks.
Unique SampleCare™
SampleCare™ constantly protects your samples and improves the quality of your data. The reduced air flow and integrated sample housing minimizes sample contamination.
Convenient Sample Control and Archiving
Control the quality of your sample with a magnified image by a CCD camera. All sample images are automatically archived for subsequent review.
High Sample Capacity
The S4 TStar sample changer offers a high capacity of up to 90 sample discs and supports automated batch processing, e.g. for efficient measurements overnight. It is designed for multi-user operation and can be loaded with up to 10 different trays. This allows loading and unloading while the instrument is measuring another sample.
Easyload™ Sample Station
Dedicated sample trays for different sample types are available. The trays are automatically recognized when inserted into the spectrometer. This prevents conflicts in case of different carrier types. It also enables the automatic loading and immediate start of any open measurement job.
Well-Designed Storage Solution
Trays can be stored in stackable boxes preventing contamination of the sample carriers. The bottom plate includes center markings, which allows direct pipetting of any sample without touching the sample carrier.
Final Results on the Spot
Typically, samples are prepared multiple times. Right after measurement the software automatically reports statistical data (average, standard deviation etc.). Standard libraries allow the determination of recoveries. Any deviation of the admissible tolerance will be highlighted.
Total reflection X-ray fluorescence (TXRF) spectroscopy is a well-established method for trace element analysis of a variety of samples. The S4 TStar simplifies TXRF for 24/7 routine operation with guaranteed data quality. Significant improvements of detection limits are accompanied by automatic QC procedures, useful software routines and a unique versatility in terms of sample types and carriers.
Your Benefits
The benchtop TXRF spectrometer S4 TStar offers lowest detection limits in the sub-ppb range.
Automatic quality control features provide confidence in data and instrument quality.
Maximum versatility for a direct analysis of many types of samples on different carriers.
Optimized for 24/7 operation in industrial routine analysis.
Designed for multi-user operation with a high capacity of 90 samples.
A selection of sample trays and other tools accelerates sample preparation and minimizes errors and contamination risks.
No Worries About New Pharma, Food and Environmental Regulations
S4 TStar is a powerful tool for food fraud prevention in globalized supply chains; e.g. food safety according to FAO/WHO standards realized by direct analysis of low levels of As in rice.
S4 TStar monitors catalyzer elements in pharmaceutical production according to upcoming US and EU Pharmacopeia guidelines; e.g. detection of sub-ppm catalyzer elements in active pharmaceutical ingredients (API) and additives.
S4 TStar provides a versatile solution for water, effluent, air and soil analysis for the recovery of a healthy environment; e.g. environmental monitoring by direct measurement of contaminants in wastewater, slurries and effluents in the low ppb range.
Outstanding Sample Versatility
The S4 TStar is a very versatile tool for the analysis of a great variety of sample types on different reflective carriers. This puts it ahead of ICP, which requires fully dissolved liquid samples.
Automatic QC Procedure
S4 TStar is the first TXRF spectrometer that automatically runs QC routines for operational and performance qualification in the background. Integrated QA samples allow automatic stability and sensitivity checks.
Unique SampleCare™
SampleCare™ constantly protects your samples and improves the quality of your data. The reduced air flow and integrated sample housing minimizes sample contamination.
Convenient Sample Control and Archiving
Control the quality of your sample with a magnified image by a CCD camera. All sample images are automatically archived for subsequent review.
High Sample Capacity
The S4 TStar sample changer offers a high capacity of up to 90 sample discs and supports automated batch processing, e.g. for efficient measurements overnight. It is designed for multi-user operation and can be loaded with up to 10 different trays. This allows loading and unloading while the instrument is measuring another sample.
Easyload™ Sample Station
Dedicated sample trays for different sample types are available. The trays are automatically recognized when inserted into the spectrometer. This prevents conflicts in case of different carrier types. It also enables the automatic loading and immediate start of any open measurement job.
Well-Designed Storage Solution
Trays can be stored in stackable boxes preventing contamination of the sample carriers. The bottom plate includes center markings, which allows direct pipetting of any sample without touching the sample carrier.
Final Results on the Spot
Typically, samples are prepared multiple times. Right after measurement the software automatically reports statistical data (average, standard deviation etc.). Standard libraries allow the determination of recoveries. Any deviation of the admissible tolerance will be highlighted.
$
11,879.00
Bruker M4 TORNADO
M4 TORNADO is the tool of choice for sample characterization using small-spot Micro X-ray Fluorescence (Micro-XRF) for information on composition and element distribution. Optimized for analysis speed and without compromising accuracy it measures a wide range of samples. Whether small or large, even or irregularly shaped — equipped with a large high-speed stage it supports 2D analysis of virtually any kind of inorganic, organic ,and even of liquid sample. Its large vacuum chamber enables light element detection.
M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50 percent higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples. This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.
M4 TORNADO provides excellent spatial resolution with spot sizes down to 25 µm for Mo Ka radiation. The new FlexiSpot feature allows to optionally chose a larger spot size of up to 200 µm for improved reproducible quantification of irregularly shaped samples, such as powders, soils or granular raw materials.
The M4 TORNADO analysis software 1.3 provides a flexible measurement setup and a variety of evaluation and processing tools. The new XMethod module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.
The M4 TORNADO can be customized to provide extended measurement ranges or even higher analysis speed: flexibility can be enhanced through installation of a second tube with a different target and a collimator. An optional second SD detector increases speed even further.
M4 TORNADO now features an optional 60 mm2 XFlash® SD detector for ultra high-speed spectra acquisition with up to 50 percent higher element sensitivity, compared to the standard 30 mm² active detector area, and significantly improves the measurement efficiency when using primary filters or analyzing light element samples. This new option is ideally suited for geology and other low yield applications, the analysis of thin samples, and low kV or tube current conditions. The 60 mm² XFlash® SDD is also available as a dual detector system which doubles sensitivity and throughput.
M4 TORNADO provides excellent spatial resolution with spot sizes down to 25 µm for Mo Ka radiation. The new FlexiSpot feature allows to optionally chose a larger spot size of up to 200 µm for improved reproducible quantification of irregularly shaped samples, such as powders, soils or granular raw materials.
The M4 TORNADO analysis software 1.3 provides a flexible measurement setup and a variety of evaluation and processing tools. The new XMethod module makes it easy to manage calibrations and standards and enables the user to develop and optimize analytical methods for complex applications, such as quantitative analysis of metallic multilayer stacks for composition and coating thickness.
The M4 TORNADO can be customized to provide extended measurement ranges or even higher analysis speed: flexibility can be enhanced through installation of a second tube with a different target and a collimator. An optional second SD detector increases speed even further.
$
10,252.00
Bruker M1 MISTRAL
The M1 MISTRAL is a compact tabletop Micro-XRF spectrometer for the analysis of bulk materials and coatings. Designed for fast and cost-efficient operation it provides accurate information on the elemental composition of materials.
The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.
The M1 MISTRAL is equipped with a high brightness micro-focus X-ray tube that ensures excellent excitation of the measurement spot resulting in a high fluorescence yield. With its powerful, yet easy-to-use, XSpect software suite, the instrument delivers accurate quantification results, no matter whether analyzing bulk materials or the most complicated multi-layer structures.
Non-destructive analysis of arbitrarily shaped samples
The M1 MISTRAL as a spectrometer for the accurate analysis of bulk and coating samples using small spot X-ray fluorescence analysis (Micro-XRF). Operating in ambient air, all elements from titanium (Z=22) upwards can be analyzed. This permits investigation of a wide range of different sample categories, including metals, alloys and metallic multi-layer systems.
Even large samples with sizes up to 100x100x100 mm³ can be analyzed. Excitation and fluorescence radiation detection takes place from above, without sample contact. This allows measurement on differently shaped samples, from flat surfaces of some GMF products to the most intricately shaped piece of jewelry.
Measurement with high spatial resolution
The M1 MISTRAL is equipped with a high brilliance micro-focus X-ray tube, which is capable of producing a high excitation intensity, even if a the smallest available collimator is used to produce a spot size of a mere 100 µm. Measurement locations can be pinpointed exactly, using the combination of video microscope and the optional motorized X-Y-Z stage.
Flexible detector configurations
The M1 MISTRAL is available in two different detector configurations, either with a large active area gas filled proportional counter for standard applications in quality control or with a silicon drift detector (SDD) for superior speed and energy resolution. The design of the detection and signal processing system warrants maximum efficiency and therefore quick results.
Powerful software
The XSpect/XS-Tools software suite provides a measurement management from spectra acquisition, via evaluation to reporting. Its tools support the analysis of bulk samples and coatings, using either standard-based quantification or a standardless Fundamental Parameter model. Reliable results can be obtained easily and routine measurements can be stored for automated reuse.
Easy to use and maintenance-free
Both the software and the M1 MISTRAL itself are designed for use by personnel that may only have received introductory training to the system. Two power outlets are all that is required to run the system. Consumables are not needed, as air-cooling is sufficient.
The instrument features high spatial resolution and spot sizes down to 100 µm. Arbitrarily shaped samples, like the most intricate pieces of jewelry, can be analyzed without further preparation, and even more important – nondestructively. Samples sizes of up to 100x100x100 mm³ are supported. A video microscope with cross hair-functionality facilitates exact pinpointing of the desired measurement location. The motorized Z-stage allows fast focusing. The optionally available X-Y-Z stage provides even more comfort.
The M1 MISTRAL is equipped with a high brightness micro-focus X-ray tube that ensures excellent excitation of the measurement spot resulting in a high fluorescence yield. With its powerful, yet easy-to-use, XSpect software suite, the instrument delivers accurate quantification results, no matter whether analyzing bulk materials or the most complicated multi-layer structures.
Non-destructive analysis of arbitrarily shaped samples
The M1 MISTRAL as a spectrometer for the accurate analysis of bulk and coating samples using small spot X-ray fluorescence analysis (Micro-XRF). Operating in ambient air, all elements from titanium (Z=22) upwards can be analyzed. This permits investigation of a wide range of different sample categories, including metals, alloys and metallic multi-layer systems.
Even large samples with sizes up to 100x100x100 mm³ can be analyzed. Excitation and fluorescence radiation detection takes place from above, without sample contact. This allows measurement on differently shaped samples, from flat surfaces of some GMF products to the most intricately shaped piece of jewelry.
Measurement with high spatial resolution
The M1 MISTRAL is equipped with a high brilliance micro-focus X-ray tube, which is capable of producing a high excitation intensity, even if a the smallest available collimator is used to produce a spot size of a mere 100 µm. Measurement locations can be pinpointed exactly, using the combination of video microscope and the optional motorized X-Y-Z stage.
Flexible detector configurations
The M1 MISTRAL is available in two different detector configurations, either with a large active area gas filled proportional counter for standard applications in quality control or with a silicon drift detector (SDD) for superior speed and energy resolution. The design of the detection and signal processing system warrants maximum efficiency and therefore quick results.
Powerful software
The XSpect/XS-Tools software suite provides a measurement management from spectra acquisition, via evaluation to reporting. Its tools support the analysis of bulk samples and coatings, using either standard-based quantification or a standardless Fundamental Parameter model. Reliable results can be obtained easily and routine measurements can be stored for automated reuse.
Easy to use and maintenance-free
Both the software and the M1 MISTRAL itself are designed for use by personnel that may only have received introductory training to the system. Two power outlets are all that is required to run the system. Consumables are not needed, as air-cooling is sufficient.
$
8,828.00
Bruker M2 BLIZZARD
Designed for the Analysis of Bulk Materials and Coatings
This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.
The M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.
Equipped with the latest version of Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD is particularly attractive for the analysis of metal multilayers that are common to PCBs. Layer systems consisting of up to 12 layers with up to 25 elements each can be characterized with regard to composition and thickness.
Experienced supervisors can use the configurability of the software to define measurement methods fine-tuned to the samples to be analyzed. These methods can then be routinely used by staff at the production site to perform the actual analyses for quality control. Setting up and performing these analyses is intuitive so that introductory training of staff is sufficient. The PASS/FAIL determination of the software or trend line display with upper and lower control limits lets the operator see immediately whether a sample is of acceptable quality or not. Reporting and data archiving functions are included as well and data can be exported to Excel®.
Bruker‘s M2 BLIZZARD is a small spot X-ray fluorescence spectrometer with the main purpose of nondestructive analysis of printed circuit boards. The slotted instrument permits safe investigation of large and small samples. The powerful
XSpect Pro software supports the compositional analysis of bulk and layer samples and the accurate determination of multilayer thickness in compliance with the ASTM B568 and DIN/ISO 3497 standards.
The M2 BLIZZARD features
ƒƒCost efficient operation
Robustness and freedom of maintenance
ƒƒEase of use
ƒAdvanced user safety
Analytical flexibility
ƒƒFast and accurate analysis
ƒA powerful software package
This small-spot X-ray fluorescence (XRF) spectrometer is specifically designed for the nondestructive analysis of printed circuit boards (PCB) in accordance with ASTM B568 and DIN/ISO 3497 standards. The slotted sample chamber and the large tray support fast and exact positioning of all types of PCBs from small to oversized that extend the sample chamber. Its rugged construction allows the M2 BLIZZARD to be used on the shop floor.
The M2 BLIZZARD is equipped with a high-performance silicon drift detector which is suitable for the analysis of thinner layers and unknowns as well as for routine analysis. The powerful video microscope system provides an auto focus function. Ease-of-use is further enhanced by software support of an optional industrial-strength foot switch and touchscreen operation.
Equipped with the latest version of Bruker’s XSpect Pro and XData software packages, the M2 BLIZZARD is particularly attractive for the analysis of metal multilayers that are common to PCBs. Layer systems consisting of up to 12 layers with up to 25 elements each can be characterized with regard to composition and thickness.
Experienced supervisors can use the configurability of the software to define measurement methods fine-tuned to the samples to be analyzed. These methods can then be routinely used by staff at the production site to perform the actual analyses for quality control. Setting up and performing these analyses is intuitive so that introductory training of staff is sufficient. The PASS/FAIL determination of the software or trend line display with upper and lower control limits lets the operator see immediately whether a sample is of acceptable quality or not. Reporting and data archiving functions are included as well and data can be exported to Excel®.
Bruker‘s M2 BLIZZARD is a small spot X-ray fluorescence spectrometer with the main purpose of nondestructive analysis of printed circuit boards. The slotted instrument permits safe investigation of large and small samples. The powerful
XSpect Pro software supports the compositional analysis of bulk and layer samples and the accurate determination of multilayer thickness in compliance with the ASTM B568 and DIN/ISO 3497 standards.
The M2 BLIZZARD features
ƒƒCost efficient operation
Robustness and freedom of maintenance
ƒƒEase of use
ƒAdvanced user safety
Analytical flexibility
ƒƒFast and accurate analysis
ƒA powerful software package
$
11,234.00
Bruker M1 ORA
Excellent analytical accuracy
The M1 ORA works in ambient air, can therefore analyze elements from titanium (Z=22) upwards and is well suited for the analysis of jewelry alloys. Samples are excited by a low power micro-focus X-ray tube. Radiation is detected by a large sensitive area proportional counter. This results in the instrument's excellent analytical accuracy, its low limits of detection and in the ability to analyze every element with a concentration higher that 0.5 %.
High spatial resolution
The measurement is contactless and non-destructive. The excitation from above with a spot size down to 0.3 mm allows exact pinpointing of the desired area for analysis, even on most intricate pieces of jewelry. Specimens may be as large as 100x100x100 mm3. Positioning is aided by a built-in video microscope with cross-hair function. For additional user comfort the manual scissor stage can be replaced with an optional motorized z-stage.
Easy-to-use software
The analysis software XSpect allows to identify and determine concentrations even of elements one would not expect to find in a jewelry alloy. The software uses state-of-the-art standardless and standard-based quantification models which provide accurate analysis with less than 0.2 % (weight) standard deviation. The software features:
Instrument control, data acquisition and management
Element peak identification
Quantitative composition analysis – standardless and standard-based
Report generation
The M1 ORA works in ambient air, can therefore analyze elements from titanium (Z=22) upwards and is well suited for the analysis of jewelry alloys. Samples are excited by a low power micro-focus X-ray tube. Radiation is detected by a large sensitive area proportional counter. This results in the instrument's excellent analytical accuracy, its low limits of detection and in the ability to analyze every element with a concentration higher that 0.5 %.
High spatial resolution
The measurement is contactless and non-destructive. The excitation from above with a spot size down to 0.3 mm allows exact pinpointing of the desired area for analysis, even on most intricate pieces of jewelry. Specimens may be as large as 100x100x100 mm3. Positioning is aided by a built-in video microscope with cross-hair function. For additional user comfort the manual scissor stage can be replaced with an optional motorized z-stage.
Easy-to-use software
The analysis software XSpect allows to identify and determine concentrations even of elements one would not expect to find in a jewelry alloy. The software uses state-of-the-art standardless and standard-based quantification models which provide accurate analysis with less than 0.2 % (weight) standard deviation. The software features:
Instrument control, data acquisition and management
Element peak identification
Quantitative composition analysis – standardless and standard-based
Report generation
$
7,761.00
Bruker S1 Sorter
The S1 SORTER Benefits
Excellent value
Entry-level XRF gun
Supports numerous applications and calibrations, such as scrap metal sorting, positive material identification (PMI), and much more
Capacity to analyze precious metals and gold
Encompasses the most common metal classes
An economical solution for scrap metal applications
Technical Details
Calibration range: 31 elements
Weight: 4.49 pounds with Batteries
Size: 30cm x 10cm x 28cm
Maximum sample temperature: 500°C
X-Ray tube: Ag target
Detector: SiPIN
Filter changer: Fixed position
Languages supported: English, Spanish, Polish, Dutch, French, Italian, German, Russian, Japanese, Portuguese, Korean, Chinese.
Common XRF Applications:
Metal Identification
Quality Assurance and Positive Material Identification (PMI) in fabrication
PMI for plant and refinery safety
Precious Metal Analysis
Aerospace alloys
Scrap Metal Sorting
And much more!
Excellent value
Entry-level XRF gun
Supports numerous applications and calibrations, such as scrap metal sorting, positive material identification (PMI), and much more
Capacity to analyze precious metals and gold
Encompasses the most common metal classes
An economical solution for scrap metal applications
Technical Details
Calibration range: 31 elements
Weight: 4.49 pounds with Batteries
Size: 30cm x 10cm x 28cm
Maximum sample temperature: 500°C
X-Ray tube: Ag target
Detector: SiPIN
Filter changer: Fixed position
Languages supported: English, Spanish, Polish, Dutch, French, Italian, German, Russian, Japanese, Portuguese, Korean, Chinese.
Common XRF Applications:
Metal Identification
Quality Assurance and Positive Material Identification (PMI) in fabrication
PMI for plant and refinery safety
Precious Metal Analysis
Aerospace alloys
Scrap Metal Sorting
And much more!
$
7,890.00
